Hitachi GR2000 Series Manual do Utilizador descarregar pdf (Página 301)

Maintenance Procedure

GR2K-GA-0015 8-39

Ver. 07-02

The test types that can be executed also differ depending on the line type. For the

relationships between line types and test types, refer to test interfaces (WAN) or bert.

Explanation of the test methods by test type as follows.

(1) Internal Loopback Test for WAN Line:

This test loops back the test frame within the NIF. The testing can be executed on

all types of WAN lines by entering test interfaces and no test interfaces commands

alternatively from the device management terminal.

For example, to test line No. 0 of NIF No. 1, enter the command lines as shown

below:

(Wait about 1 minute.)

The result will appear as shown in Figure 8-41 where you must make sure that

“Send-NG” and “Receive-NG” are both 0. If “Send-NG” and “Receive-NG” are

both 0, the result is normal.

Figure 8-41 Sample Result of Internal Loopback Test for WAN Line

(2) Loop Connector Loopback Test for WAN Line:

This test loops back the test frame at the loop connector connected to the NIF.

The test can be executed on all types of WAN lines by entering the test interfaces

and no test interfaces commands from the device management terminal. Before

testing, disconnect the cable of the subject line number and replace with a loop

connector of the applicable line type.

Note 1:

If “Send-NG” and “Receive-NG” are not 0, there is an apparent problem. Analyze the

result in accordance with a result of the no test interfaces (WAN) information in

GR2000 Operations Commands, Vol. 1.

Note 2:

The test can be executed on the NIF boards OC-3c (8 ports), OC-12c (4 ports), and

OC-48c only when the clock of the configuration definition information line is set to

“independent.” If the clock is set to “external,” a line fault is likely to occur.

Must be 0

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Hitachi GR2000 Series Manual do Utilizador Página 301